Abstract:

A new objects thickness measurement methodwas proposed for the fact that the attenuation coefficient could not be deriveddirectly in the detection process. Applying the X-ray attenuation principle in industrial CT and the Compton scattering effect appearing inside high-energy photons of theobjects, a functional relationship between the object density and the attenuation coefficient was built and, based on this, the accurate thickness of objects can be calculated rapidly. A simulation was given to show the effectiveness of the proposed method.

Key words: X-ray; Compton scattering; measurement; thickness